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KMID : 1151820120060010073
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Journal of the Korean Society of Radiology
2012 Volume.6 No. 1 p.73 ~ p.77
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The Design and Fabrication of Conversion Layer for Application of Direct-Detection Type Flat Panel Detector
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Noh Si-Cheol
Kang Sang-Sik
Joeng Bong-Jae
Choi Il-Hong
Cho Chang-Hoon
Heo Ye-Ji
Yoon Ju-Sun
Park Ji-Koon
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Abstract
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Recently, Interest to the photoconductor, which is used to flat form X-ray detector such as a-Se, HgI₂, PbO, CdTe, PbI₂ etc. is increasing. In this study, the film layer by using the photoconductive material with particle sedimentation was fabricated and evaluated. The quantization efficiency of the continuous X-ray with the 70 kVp energy bandwidth was analyzed by using the Monte Carlo simulation. With the results, the thickness of film with 64 % quantization efficiency was 180 μm which is similar to the efficiency of 500 μm a-Se film. And HIg₂ film has the high quantization efficiency of 74 % on 240 μm thickness. The electrical characteristics of the 239 μm Hgl₂ films produced by particle sedimentation were shown as very low dark current(under 10 pA/㎟), and high sensitivity(19.8 mC/mR-sec) with 1 V/μm input voltage. The SNR, which is influence to the contrast of X-ray image, was shown highly as 3,125 in low driving voltage on 0.8 V/μm. With the results of this study, the development of the low-cost, high-performance image detector with film could be possible by replacing the film produced by particle sedimentation instead to a-Se detector.
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KEYWORD
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detector, X-ray image, particle sedimentation, HgI2, SNR
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